Advanced Equipment and Qualified Personnel for All Your PAT Needs
A key service that adds considerable value to the contract manufacturing of Printed Circuit Assembly (PCA) is the ability to deliver fully tested products, ready to be integrated into the next phase of the product supply chain. By undertaking most of the required testing during the manufacturing process, improvements are accelerated, quality is enhanced and time-to-market is reduced.
Whether the product is a fully configured network, medical product, or sophisticated RF module, the appropriate level of testing depends on the product specification and the individual customer requirements. SEM has invested in the latest testing equipment and training to keep up with industry requirements.
The range of post-assembly test (PAT) services offered at SEM includes the following:
- Test System Development
- Functional Testing
- In-Circuit Testing
- Single-sided Flying Probe Testing
- Double-sided Flying Probe Testing
- Burn-In
- Thermal Cycling
Some of the equipment/processes used for testing and validation are:
Flying Probe Testing
We offer passive and active testing on two flying probe platforms. Flying probe testing with Acculogic Scorpion FLS 850 is capable of testing the top and bottom sides simultaneously.
Flying probe testing with Teradyne Javelin has been upgraded to Acculogic Sprint with single-sided testing.
Functional Testing and In-Circuit Testing
SEM can coordinate in-circuit testing on any platform. We work with qualified testing partners in order to provide a wide range of in-circuit test platforms at affordable costs.
We provide functional testing assistance at any level from PCA to fully integrated systems. We have qualified engineers, technicians, and operators to assist in the testing and debugging of your product with functional testing, as required.
We can assist with JTAG testing and test emulation as part of functional testing or independent test and debugging. We can also perform static or dynamic, ambient or controlled temperature burn-in testing.
Automatic Optical Inspection (AOI)
SEM has invested in 2D and 3D AOI systems, to enhance our inspection capabilities. By placing AOI at critical checkpoints, consistent quality and yields are produced in ramp-up, ramp-down, or day-to-day processes.
X Ray Inspection
SEM has state-of-the-art machines for both 2D and 5D X-rays that are capable of creating many different analysis reports for SMT, through-hole, and press-fit components, including BGA and other exotic components.